W. A. Blanpied, L. B. Levit, E. Engels, M. Goitein, T. Kirk, D. G. Ryan, D. G. Stairs, SEARCH FOR A CP-NONCONSERVING ASYMMETRY IN THE DECAY KL→p++ p-+ pO, Phys. Rev. Lett. 21, 1650 – Published 9 December 1968 C.R. Gillespie, R.W. Huggett, D.R. Humphreys, W.V. Jones, L.B. Levit (Louisiana State U.), NASA-CR-124697 Measurement Of The Nuclear Electromagnetic Cascade Development In Glass At Energies Above 200-GeV, 1971 - 5 pages
S. C. Barrowes, R. W. Huggett, L. B. Levit, L. G. Porter, Cosmic-Ray Cascades Photographed in Scintillator, Proceedings of the 13th International Conference on Cosmic Rays, held in Denver, Colorado, Volume 4 (AS and TI Sessions)., p.2767, 1973
Barrowes, S. C.; Huggett, R. W.; Jones, W. V.; Levit, L. B.; Porter, L. G., Search For A Particle With A Long Interaction Length, International Cosmic Ray Conference, 14th, Munich, West Germany, August 15-29, 1975, Conference Papers. Volume 7. (A76-26851 11-93) Munich, Max-Planck-Institut für Extraterrestrische Physik, 1975, p. 2421-2425., 1975.
Lawrence B Levit, Modular Trigger Processing Systems, IEEE Transactions on Nuclear Science, Volume:33 Issue:1, Feb. 1986. L. Levit, and B. Baumgartner, Ionizer-Induced Offset Voltages on Workplace Objects Compared to Standard Charged Plate Monitor Readings Proceedings IDEMA Symposium: Understanding ESD and EMI Issues in Magnetic Recording, Santa Clara, CA, May 22, (1997).
Levit, L. and Wallash, A., Measurement of the Effects of Ionizer Imbalance and Proximity to Ground in MR Head Handling, Proceedings of the 20th EOS/ESD Symposium, Reno, Nevada, October 6-8, 1998, Paper 4B.7, p. 375
A. Steinman and L. B. Levit, It’s the Hardware. No, it’s the Software. No it’s ESD! , A Supplement publication to Solid State Technology, May 1999.
Larry B. Levit, Gaurisha Gajjar Desai, William Vosteen, Measurement of Ionizer Performance –a New Approach, Proceedings of the 21st EOS/ESD Symposium, Orlando FL, 1999, pp. 124-129,
L.B. Levit et al., Contamination Control in Semiconductor Manufacturing, Proc. of SEMICON Taiwan, Taipei, Taiwan, Sept. 1999,
Levit Larry B, Guan, Wei , Hsu, Wang-Tsai , Handley Tom, Curran, Frank, Effects of Static Charge on Contamination Control in Semiconductor Manufacturing, Proceedings Semicon, China, Shanghai, China, April, 2000.
L.Levit, 157nm Reticle Handling Meeting, SD Prevention with Corona Ionizer and Alpha-Emitter (Po210) Ionizers , May 2000 Monterey CA, September 12, 2000. E L.B. Levit, A. Steinman, Investigating Static Charge Issues in Photolithography Areas, MICRO, June 2000,.
J. Montoya, LB. Levit, and A, Englisch, A Study of the Mechanisms for ESD Damage to Reticles, Proceedings of the 22nd Annual EOS/ESD Society, (Rome, NY: ESD Association, 2000), pp 394–405,
A. C. Rudack, M. Pendley and L. B. Levit, Measurement Technique Developed to Evaluate Transient EMI in a Photo Bay with and without Air Ionization, Proceedings of the 22nd EOS/ESD Symposium, Sept 26-28, 2000, Anaheim, CA, pp. 379-386.
L.B. Levit, T.M. Hanley, F. Curran, Watch Out For Electrostatic Attraction, Solid State Technology, June 2000.
J. Montoya, L.Levit and A. Englisch, A Study of the Mechanisms for ESD Damage to Reticles, IEEE Transactions on Electronics Packaging Manufacturing, vol. 24-2, pp.78-85, April 2001.
L. Levit and A. Englisch, Canary Reticle-A New Diagnostic for Reticles and a Window into the Physics of ESD Damage to Reticles, SPIE Journal, June 2001.
Levit, L.B, Weil G., Reticle Boxes, ESD Control and Electrostatic Shielding, International Sematech ESD Conference, October 2001, Austin, Texas, http://ismi.sematech.org/meetings/archives/other/2001.1020/10.pdf,
Larry B. Levit, Ph.D. and Wei Guan, Ph.D., Measuring Tribocharging Efficiency in Varying Atmospheric Humidity and Nitrogen, Proceedings of the Annual Conference of the Electrostatics Society of America, June 27-30, 2001,
Larry B. Levit and Wei Guan, Measurement of the Magnitude of Triboelectrification in the Environment of the 157 nm Stepper. Proceeding of the 21st Annual BACUS Symposium on Photomask Technology, 3-5 October, 2001, Monterey, CA, USA, p307-312,
L.B. Levit, L.G. Henry, J.A. Montoya, F.A. Marcelli and R.P. Lucero, Investigating FOUPs as a Source of ESD-Induced Electromagnetic Interference, Micro, April 2002, p. 41, Pendly, Michael C., Levit Larry, Rudack Andrew, Measurement Technique Developed to Evaluate Transient EMI in a Photo Bay, Journal of Electrostatics Volume 54, Number 1, January 2002 , pp. 95-104,
Levit, Larry B. Transporting FOUPs as a Driver for ESD-Induced EMI, Proceedings of the Electrostatics Society of America, Northwestern University Chicago IL, June 26-28 2002, pp 145-146,
Carl Newberg, Larry Levit, A Study of the Short Term Balance Properties of Ionizers of Various Technologies, ESD Journal, July 23, 2002, Levit, L.B., Montoya, J.A. Transporting FOUPs as a Driver for ESD-Induced EMI, Proceedings of the 2002 Advanced Semiconductor Manufacturing IEEE/SEMI Conference and Workshop pp 289- 294
Larry B. Levit, Ph.D., Peter Gefter, Ph.D., and Guan Wei, Ph.D., Maxwell’s Equations Applied to Ionizers, the CPM and Various Products in High Technology Manufacturing, Proceedings of the 2003 Taiwan ESD Association Conference, Hsinchu, Taiwan,
Crowley,J., Ignatenko, A., Levit, L. B., Biased-Plate Characterization of Pulsed DC Ionizers, Proceedings of the 25th Electrical Overstress Electrostatic Discharge Symposium 2003, pp 285-290,
Rudack, A, Pendley, M.C., Gagnon, P., Induced ESD Damage on Photomasks, Proceedings of the 25th EOS/ESD Symposium, Las Vegas, NV, September, 2003,
Rudack, Andrew and Levit, ESD Effects on Reticles, Lawrence, presented at ESD Control Workshop, Semicon West, San Francisco CA, July 14, 2003.
A. Wallash and L. Levit, Electrical Breakdown and ESD Phenomena for Devices with Nanometer-to-Micron Gaps, Proceedings of SPIE-Reliability, Testing and Characterization of MEMS/MOEMS II, pp. 87-96, San Jose, California, January 2003,
J. M. Crowley, A. Ignatenko, L. Levit, Biased-plate characterization of pulsed DC ionizers, Journal of Electrostatics, Vol. 62, pp. 219-230 (2004)
J. M. Crowley, D. Leri, G. Dahloff, L. Levit, Equivalent Circuits For Air Ionizers Used In Static Control, Journal of Electrostatics, Vol. 61, No. 2, pp. 71-83 (2004)
Larry B. Levit, Ph.D., Rob K. Brown,, Jessica Figueroa, Christopher W. Long, and James Peterman, Effect of Ionization upon the Wet Cleaning Process, Advanced Semiconductor Manufacturing Conference 2005, Boston MA,
Lawrence B. Levit, Ph.D., Peter Gefter, Ph.D., Ionization Applications and Pitfalls for Charge Neutralization in Substrate Handling, Proceedings of the 28th EOS/ESD Symposium, 10-15 Sept. 2006 pp 246-252, Paper 4B. 4. Tucson AZ,
Brown R., and Levit, L., , Measuring the PWP of the Handling Component of a Cryogenic Cleaning Tool, ICCCS Proceedings, 2004, Bonn, Germany
Steiniman, A, Levit L., Improving Semiconductor Yields with Air Ionization, 2006 Taiwan Electrostatic Discharge Conference, November 6-8 Hsinchu, Taiwan pp 43-47,
Long, C.W. Peterman, J., Levit L., 2007 Effects of Ionization on Airborne Particles in a Semiconductor Front-End Fab, Taiwan Electrostatic Discharge Conference November 2007, Hsinchu, Taiwan,
Peter Gefter, Lawrence Levit, A Method of Evaluating Ion Emitters for Corona Ionizers , Proceedings of the 29th Annual Conference of the Electrostatics Society of America, June 2007, Purdue University, West Lafayette IN,
C.W. Long, J. Peterman, L.B. Levit, Arnold Steinman, Cheryl Avery, Improving Particle Contamination Control with in-tool Air Ionization , Solid State Technology March 2007,
Larry Levit and Arnold Steinman, Relevance of Electrostatic Discharge Controls to Particle Contamination in Cleanroom Environments, Developments in Surface Contamination and Cleaning Fundamentals and Applied Aspects, Edited by Rajiv Kohli and K.L. Mittal, December 2007 William Andrew Publishing,
Lawrence B. Levit, Measuring the PWP Improvement in the Handling Component of a Semiconductor Process Tool from Air Ionization, Journal of the IEST, Volume 51, Number 1 / April 2008, pp 114 – 121,
Larry Levit, Greg Endow, Bruce Williams, Ronald Slaby, Considerations for CPM Measurements of Fast Switching Ionizers Paper 2B6, Proceedings of the 30th EOS/ESD Symposium, 7-12 Sept. 2008 Tucson AZ.
Larry Levit and Douglas Beyer, Air Ionization With No Contaminating Particles, Proc. ESA Annual Meeting on Electrostatics 2011, Generating, June 14-16, 2011, Case Western Reserve University, Cleveland OH.
Larry Levit, Proc. A Study of the Static Discharging Power of a Decaying Alpha Source , ESA Annual Meeting on Electrostatics 2013, June 11-13, 2013, Cocoa Beach, FL, paper H2.
Gregory Gumkowski , Lawrence Levit, A New Look at the Financial Impact of Air Ionization, Proceedings of the 2013 Electrostatic Discharge Association,Las Vegas NV, Paper 7B.4.
Lawrence Levit and Geoff Weil, A Study of the Ionizer Charge Carriers in a Nitrogen Atmosphere and A Method for Balancing an Accelerated Alpha Ionizer, Proceedings of the Taiwan Electrostatic Discharge Symposium, Hsinchu, Taiwan
Lawrence Levit and Geoff Weil, Evaluation of the Performance of Corona and Hybrid Ionizers in Nitrogen, ESD Symposium on Factory Issues, November 7-8, 2012. TÜV SÜD PSB Pte. Ltd., 1 Science Park Drive, Singapore, 118221, Paper 2B.3.
Tom Watkins, Geoff Weil, Larry Levit, Creating Ionization in Nitrogen. Annual Technical Meeting of the Institute of Environmental Sciences and Technology 2012 (ESTECH), Orlando FL, 1-3 May, p165
Lawrence Levit, LBL Scientific; Christopher Lemke, Trek, Inc.; Michael Rataj, Aramark, Inc.; Geoffrey Weil, Anodyne Research, Measuring the Body Voltage on Wearers of Category 3 Bunnysuits, 39th Annual EOS/ESD Symposium, September 10-15, 2017 Westin La Paloma Resort, Tucson, AZ, USA. Paper 4B4
Lawrence Levit, William Vosteen, Geoffrey Weil, Analysis of Pulsed DC Ionizer Measurement Procedures with a CPM Using ESDA RP 3.11-2006, 37th Annual EOS/ESD Symposium, Peppermill Resort, Reno NV, September 27- October 2, 2015 Paper 1B1
Larry B. Levit, LBL Scientific, Use of the Digital Sampling Oscilloscope for ESD Measurements, Tutorial DD/FC122, 37th Annual EOS/ESD Symposium, Peppermill Resort, Reno NV, September 27- October 2, 2015,
Lawrence Levit, Geoffrey Weil, A Novel New Concept in Hybrid Alpha Ionization Systems, 37th Annual EOS/ESD Symposium, Peppermill Resort, Reno NV, September 27- October 2, 2015, Paper 1B3
Semiconductor Manufacturing, Second Edition, Hwaiyu Geng, Chapter 41, ESD Controls in Cleanroom Environments, Larry Levit, p 421-435, McGraw-Hill, NY, 2018