Partial List of Static Control Publications for Larry Levit, continued
L.B. Levit, T.M. Hanley, F. Curran, Solid State Technology, June 2000. Watch Out For Electrostatic Attraction, Article
L.B. Levit, A. Steinman, MICRO, June 2000,.Investigating Static Charge Issues in Photolithography Areas Article
J. Montoya, LB. Levit, and A, Englisch, Proceedings of the 22nd Annual EOS/ESD Society, (Rome, NY: ESD Association, 2000), pp 394–405, A Study of the Mechanisms for ESD Damage to Reticles.Abstract
Levit, L. and Wallash, A., Proceedings of the 20th EOS/ESD Symposium, Reno, Nevada, October 6-8, 1998, Paper 4B.7, p. 375, Measurement of the Effects of Ionizer Imbalance and Proximity to Ground in MR Head Handling Abstract
A. Steinman and L. B. Levit, A Supplement publication to Solid State Technology, May 1999. It’s the Hardware. No, it’s the Software. No it’s ESD! Article
L. Levit, and B. Baumgartner, Proceedings IDEMA Symposium: Understanding ESD and EMI Issues in Magnetic Recording, Santa Clara, CA, May 22, (1997). Ionizer-Induced Offset Voltages on Workplace Objects Compared to Standard Charged Plate Monitor Readings Abstract
Levit, L. and Wallash, A., Proceedings of the 20th EOS/ESD Symposium, Reno, Nevada, October 6-8, 1998, Paper 4B.7, p. 375, Measurement of the Effects of Ionizer Imbalance and Proximity to Ground in MR Head Handling Abstract
Larry B. Levit, Gaurisha Gajjar Desai, William Vosteen, Proceedings of the 21st EOS/ESD Symposium, Orlando FL, 1999, pp. 124-129, Measurement of Ionizer Performance –a New Approach Abstract
A. C. Rudack, M. Pendley and L. B. Levit, Proceedings of the 22ndEOS/ESD Symposium, Sept 26-28, 2000, Anaheim, CA, pp. 379-386.Measurement Technique Developed to Evaluate Transient EMI in a Photo Bay with and without Air Ionization Abstract
J. Montoya, L.Levit and A. Englisch, IEEE Transactions on Electronics Packaging Manufacturing, vol. 24-2, pp.78-85, April 2001. A Study of the Mechanisms for ESD Damage to Reticles. Abstract
Larry B. Levit, Ph.D. and Wei Guan, Ph.D., Proceedings of the Annual Conference of the Electrostatics Society of America, June 27-30, 2001, Measuring Tribocharging Efficiency in Varying Atmospheric Humidity and Nitrogen
Larry Levit, Gaurisha Gajjar Desai ,Terrence Coates, Andrew C. Rudack, A Study of the Mechanisms for ESD Damage to Reticles, International Sematech Electrostatic Discharge Impact and Control Workshop, Austin TX, Oct 19, 20 2000. PPT
Larry B. Levit and Wei Guan, Proceeding of the 21st Annual BACUS Symposium on Photomask Technology, 3-5 October, 2001, Monterey, CA, USA, p307-312, Measurement of the Magnitude of Triboelectrification in the Environment of the 157 nm Stepper Abstract
Interference L.B. Levit, L.G. Henry, J.A, Montoya and R.P. Lucero, Micro, April 2002, p 41,Investigating FOUPs as a Source of ESD-Induced Electromagnetic Interference. Article
Pendly, Michael C., Levit Larry, Rudack Andrew, Journal of Electrostatics Volume 54, Number 1, January 2002 , pp. 95-104, Measurement Technique Developed to Evaluate Transient EMI in a Photo Bay Abstract
Carl Newberg, Larry Levit, ESD Journal, July 23, 2002, A Study of the Short Term Balance Properties of Ionizers of Various Technologies Article
L.B. Levit, Alpha Ionization for Neutralizing Sensitive Components in Tight Confines, Application Note
Larry Levit, Greg Endow, MKS Ion Systems, Bruce Williams, Ronald Slaby Paper 2B6, Proceedings of the 30th EOS/ESD Symposium, 7-12 Sept. 2008Tucson AZ. Considerations for CPM Measurements of Fast Switching Ionizers Article
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